IEEE Seasonal School: Manufacturability, Testing, Reliability, and Security
00:00:00 – Introduction
01:51:00 – “Machine Learning for DFM”, Bei Yu, Associate Professor, Chinese University of Hong Kong
59:54:00 – “ML for Testing and Yield”, Li-C. Wang, Professor, UC Santa Barbara
01:59:00 – “ML for Cross-Layer Reliability and Security”, Muhammad Shafique, Professor of Computer Engineering, NYU Abu Dhabi